
The space environment is harsh for semiconductor devices! ?
Last time, we discussed the effects of space radiation on semiconductor devices.
He explained that "the space environment contains cosmic radiation, making it a harsh environment for semiconductor devices."
This time, we will introduce in detail the "SEE" that was introduced in the article.
Learn about SEE (Single Event Effect)
SEE(Singe Event Effects: Single event effect), Protons and heavy ions in semiconductor devices etc. One high energy particle is incident death,
The ionization process produces The chargeorigin This results in Transient Current Due to "Causing temporary malfunction or permanent failure of the device" I say.
The former type of temporary malfunction caused by SEE is called a soft error.
- SEU(Single Event Upset)
- SET(Single Event Transient)
- SEFI(Single Event Functional Interrupt)
appear as phenomena such as
On the other hand, the latter permanent failure due to SEE is called a hard error.
- SEL(Single Event Latch-up)
- SEB(Single Event Burn-out)
- SEGR(Single Event Gate Rupture)
This appears as a phenomenon such as
These SEE-related errors, especially hard errors, can have a detrimental effect on equipment, systems, and missions.
It is possible that it will have an impact, so you need to consider the impact.
What devices are immune to SEE (Single Event Effects)?
Not all semiconductor devices for space use are available, but
There is information about SEE resistance in the manufacturer's data sheet, etc.
On the other hand, there is almost no information available on SEE resistance for other devices.
Such devices should be subjected to a resistance assessment if necessary.
this SEE For resistance evaluation, Heavy ions and protons accelerated by accelerators etc.
Irradiate the device to be evaluated SEE I have an exam.
In this SEE test, we investigated the conditions under which the aforementioned heavy ions and protons were irradiated.
We will measure "what kind of SEE phenomenon occurs and to what extent."
In the explanation so far, SEE means "there is a software/hardware error" and
Also, did you understand that devices that are SEE resistant are "devices that have passed the SEE test and have been carefully selected"?
In the next article, we will discuss measures to prevent SEE from occurring.
We will be digging deeper and explaining more. Please look forward to it.
For SEE (single event effect), Macnica!
Macnica also accepts consultations regarding "Radiation Resistance Testing and Evaluation (TID/SEE) requirements."
In addition to consulting about radiation testing,
We also provide support for the following "reliability of semiconductor devices for space".
- Implementation support for tests, inspections, and analyzes at external facilities in Japan and overseas, and interface with facilities
- Conducting non-destructive testing using Macnica 's in-house X-ray inspection equipment
If you have any problems regarding "Space Semiconductors", please feel free to contact us using the inquiry form below.
We will support you based on Macnica 's"abundant experience"and"high technology."
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