Get to know SEE (single event effects).

SEE (Singe Event Effects)​ ​occurs when a single high-energy particle such as a proton or heavy ion enters a semiconductor device,

generated by its ionization action charge isorigin occur as transient current by "Causing temporary malfunction or permanent failure of the device" say.

The former temporary malfunction caused by SEE is called a soft error.

• SEU(Single Event Upset)
• SET(Single Event Transient)
• SEFI(Single Event Functional Interrupt)

appear as phenomena such as

On the other hand, the latter permanent failure due to SEE is called a hard error.

• SEL(Single Event Latch-up)
• SEB(Single Event Burn-out)
• SEGR(Single Event Gate Rupture)

appear as phenomena such as

Errors caused by these SEEs, especially hard errors, affect equipment, systems, and missions.

It can have an impact and should be considered.

What devices are immune to SEE (Single Event Effects)?

Semiconductor devices for space use are not all of them, but

There is a description about SEE resistance in the data sheet of the manufacturer.

On the other hand, since most other devices do not have information on SEE resistance,

​Immunity evaluation should be performed for such devices, if necessary.

As this SEE resistance evaluation, heavy ions and protons accelerated by the accelerator are

There is an SEE test that irradiates the device under evaluation.

In this SEE test, under what conditions the aforementioned heavy ions and protons were irradiated,

We will measure "what kind of SEE phenomenon​ ​occurs and to what degree".

In the explanations so far, SEE means "soft/hard error",

Also, do you understand that SEE-resistant devices must pass the SEE test and be carefully selected?​


In the next and subsequent articles, we will discuss countermeasures to prevent SEE from occurring.

I'll dig into it and explain. looking forward to.