In various fields such as factory automation, logistics robots, and security, there is a growing need to "capture the position and shape of objects in three dimensions." However, existing 3D sensors have drawbacks such as "insufficient resolution," "inability to be used outdoors," and "large and expensive systems."
This article will explain how ON Semiconductor's Hyperlux ID family of indirect ToF (iToF) sensors can solve these customer challenges.
Why is depth sensing in demand now?
3D sensing is a general term for technologies that capture and digitize the three-dimensional shapes of the surrounding environment and objects. At its core is "depth sensing," which measures the distance (depth) to an object. It forms the foundation for advanced functions such as 3D mapping, object recognition, and spatial recognition, and has become an indispensable technology in fields where shape, position, and movement need to be understood accurately in real time.
With the advancement of smart factories, there is a growing need in many workplaces to acquire "height" information, which was difficult to obtain with conventional 2D cameras, in order to achieve highly accurate positioning and situation-dependent control.
Main depth sensing methods and their respective challenges
There are several representative methods for depth sensing, each with its own strengths and weaknesses.
| method | Features | Main challenges |
| Stereovision | The distance was calculated using triangulation based on the parallax between the two cameras. It is less affected by the reflectivity of the object. |
The camera spacing and accuracy are a trade-off, making miniaturization difficult. Accuracy decreases and the computational load increases in dark environments. |
| Structured Light | A specific light pattern is projected, and depth is obtained from the resulting distortion. A high-precision 3D scanner can be configured. |
It has a high computational load and is unsuitable for measuring moving objects because it cannot accurately measure if the object moves during measurement. |
| Direct ToF (dToF) | The round-trip time of the light pulse is measured directly. It is widely used in long-range, high-precision applications such as LiDAR. |
Because it basically measures a single point (1D), achieving high resolution is difficult, and the cost tends to be high. |
| Indirect ToF (iToF) | The distance is calculated from the phase difference of the modulated light. It can simultaneously obtain the distance across the entire screen, making it easier to achieve high resolution. The amount of computation required is also relatively small. |
It is susceptible to ambient light (such as sunlight) and has a short measuring range. Because multiple exposures are required, blurring occurs with fast-moving subjects. |
iToF depth measurement principle
The phase difference is determined by measuring four phases.
- Light modulated at a specific frequency is shone onto the surface, and the phase shift of the reflected light that returns is measured. (Δφ) We will find the distance from.
To find Δφ, 0° ・ 90° ・ 180° ・ 270° of 4 The signal is acquired in two phases.
Therefore, the depth frame 1 To get one lowest 4 number of exposures It is required.
Convert the phase difference to distance.
"Distance ambiguity" due to phase periodicity
Because the phase repeats periodically, if the distance to the target exceeds one cycle, it becomes impossible to distinguish which cycle the measured phase belongs to.
Example: At 60MHz, one period is 2.5m, so an object with a 3m period will be incorrectly measured as 0.5m.
Therefore, the maximum distance that can be measured is, in principle, one period of the modulation frequency (phase 0 to 2π).
The distance of one period is determined by the following formula, and it becomes shorter as the frequency increases.
For example, 1.5m for 100MHz and 2.5m for 60MHz.
iToF inherently possesses great potential in terms of high resolution, real-time capabilities, and low computational requirements.
However, its susceptibility to ambient light and short range have limited its practical applications.
Hyperlux ID was developed to overcome this obstacle.
Hyperlux ID solves customer challenges
Hyperlux ID is a high-performance iToF sensor family that leverages ON Semiconductor's advanced pixel and stacking technologies, and consists of two products: AF0130 and AF0131. Here, we introduce solutions using Hyperlux ID for common customer challenges.
Problem ①: "The resolution is insufficient, making it impossible to capture fine details and small parts."
Many iToF sensors on the market are limited to VGA resolution. The Hyperlux ID boasts a high resolution of 1.2 megapixels, up to approximately four times the resolution of typical iToF sensors, enabling more precise measurements. Furthermore, because it supports binning, it can also be used as a more sensitive VGA sensor in applications where VGA resolution is sufficient.
Problem ②: "Depth calculation requires FPGAs and processors, making the camera large and expensive."
The AF0130 integrates depth calculation functionality into the sensor. This offers the following advantages:
-Reduced component costs: This allows for the elimination of high-performance FPGAs and other components used for calculations, leading to a smaller camera.
• Flexibility in processor selection: The computing resources of a high-performance processor can be allocated to other applications, or replaced with a lower-cost processor.
For customers who wish to use their own custom calculation algorithms, we also offer the AF0131, which does not have calculation capabilities.
Problem 3: "When measuring a moving object, the results tend to be inconsistent."
Conventional iToF sensors read data externally for each phase of exposure, which means there is a time lag between the first and last exposures. If the subject moves during this time, motion artifacts (blur) occur.
Hyperlux ID directly stores information for four phases in single-frequency mode and eight phases in dual-frequency mode in the memory within the pixel.
Because exposure for the next phase can be started in a very short time, the total exposure time for all four phases is reduced, minimizing blur. This is highly effective in dynamic environments such as measuring goods moving on a conveyor belt or measurements taken from moving robots.
Problem 4: "The measurable distance is short, and it cannot cover a large space."
Hyperlux ID features a dual-frequency mode that handles two modulation frequencies within a single frame.
External processing is unnecessary, the frame rate does not decrease, and exposure time is reduced by 8 phases thanks to in-pixel memory (the maximum resolution when using dual frequency is VGA).
In addition, the quantum efficiency (QE) in the 940nm band exceeds 40%, compared to 20-30 % for conventional products. As reflected light weakens with distance, this improved sensitivity significantly contributes to increased measurement range and accuracy.
Problem 5: "It cannot be used outdoors due to the effects of sunlight."
iToF is generally susceptible to ambient light such as sunlight, and has tended to be limited to indoor applications. Hyperlux ID has enhanced ambient light rejection capabilities, allowing for accurate depth results even in sunlight.
Usage scenarios: This helps solve the following problems
| Usage Scenarios | Customer challenges | The benefits of implementing Hyperlux ID |
| Collaborative robot (picking) | It cannot accurately grasp bulk parts. The robot stops every time a person approaches, reducing productivity. | High-resolution 3D point clouds support accurate picking. Real-time distance tracking allows for speed control without stopping the production line. |
| AMR/AGV (Logistics Robot) | The accuracy of self-localization and obstacle avoidance is insufficient. It malfunctions outdoors or in bright environments. | It acquires depth information necessary for SLAM from medium to long distances. It is highly resistant to ambient light and can easily handle transport that spans both indoor and outdoor environments. |
| Measuring and sorting the dimensions of packages | The shape and volume of packages on the conveyor belt are measured manually or with 2D cameras, which is inefficient. | Real-time measurement with reduced motion blur contributes to the automation of identification and sorting. |
| Visual inspection and quality control | Surface irregularities and distortions, and other defects in the height direction, can be overlooked in 2D image processing. | With modulation frequencies up to 200MHz, it enables high-precision short-range measurements, facilitating the detection of minute shape defects. |
| Access control (3D facial recognition) | Impersonation using photos and deepfakes, and decreased recognition accuracy in dark places. | This technology contributes to preventing impersonation through 3D depth information and improving recognition accuracy in low-light environments using near-infrared light. |
| Intrusion Detection | 2D surveillance cameras cannot determine distance, leading to many false detections. | 3D boundary monitoring and person tracking, combined with distance information, helps reduce false positives. |
| Retail and AR/VR | We want to improve the accuracy of AI recognition, gesture recognition, and spatial mapping. | By combining highly accurate depth data with AI, we enable real-time analysis and immersive experiences. |
AF0130 Product Specifications
| function | data |
| resolution | 1280(H) x 960 (V) |
| optical size | 1/3” |
| pixel size | 3.5µm back-side illumination |
| Shutter types | global |
| frame rate | 1.2 MP, 60 fps |
| Quantum efficiency (940nm) | 43% |
| Maximum modulation frequency | 200MHz |
| Modulation contrast | >95% |
| On-chip depth FPS |
Up to 60fps @ Full Res 100fps @ VGA |
Summary
Hyperlux ID is a high-performance iToF sensor family that overturns the conventional wisdom of iToF sensors, such as "low resolution," "susceptibility to ambient light," and "short measuring range."
It enhances resolution and accuracy from short distances to long distances of up to 30 meters, contributing to improved depth sensing performance in a variety of industrial, commercial, and consumer applications.
Source: Based on onsemi's"Overcoming Challenges through Indirect Time-of-Flight Advancements" (TND6479/D Rev. 2, August 2025).
Hyperlux is a trademark of Semiconductor Components Industries, LLC dba “onsemi”.
For ON Semiconductor's document TND6479/D, please register for My ON on the ON Semiconductor website, log in, and then check the document.
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