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Texas Instruments C2000 Delfino series: Is it possible to check the ECC (SEDED) circuit of the flash memory?
Yes. It is possible. I will introduce two methods.
[1] Please use the ECC test mode to check the judgment capability of the SECDED circuit. You can freely set the conditions.
[2] When inputting data from the actual flash memory device to the SECDED circuit, write test data to the flash memory using the flash memory API Fapi_issueProgrammingCommand(). It supports error injection.
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