A complete guide to AFE (Analog Front End) - a revolutionary technology that enables flexible and cost-effective analog input/output device design

■Seminar Contents:

Analog I/O designs in FA equipment are becoming increasingly diverse (multiple channels, multiple inputs) and highly accurate (±0.01% system accuracy).

To address these challenges, NXP's latest AFE, the NAFEE33xx, features software-designable universal I/O and advanced diagnostic functions, delivering design flexibility, development efficiency, and functional safety.

In this webinar, we will explain its groundbreaking features and how to use it.

■Target:

・Analog input/output device designer for FA equipment

・Those involved in the development of multi-function PLCs, remote I/O, RTD/PTC/NTC, load cells, etc.

■Registration:

・ Registration URL: Click here to apply

Date and time: Tuesday, August 26, 2025, 11:00 AM - 11:50 AM JST

Participation fee: Free

・Pre-registration required: Participation URL will be sent within 1 business day after registration.

・ Registration closes: Monday, August 25th, 17:00 (Please note that if you register after the registration closes, we may not be able to send you the participation URL.)

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*Please note that we will not accept participation from trading companies related to competitors, or individuals for personal use (hobby users, or those who register with free email addresses such as Gmail/personal addresses).