To fully utilize power devices such as SiC, GaN, and IGBT, it is extremely important to understand the characteristics of the devices. By switching the actual power device and correctly observing the switching loss, recovery characteristics, voltage/current overshoot, etc. at that time, it may be possible to prevent problems in the development of the application in advance. .
Therefore, it is very important to perform a double-pulse test to observe these transient phenomena before implementing them in the actual application or board. The values listed in the data sheet are only typical values under certain conditions; the double pulse test, which can be measured under any operating conditions (voltage/current), This makes it possible to observe how the system behaves.
Macnica has developed a highly versatile double pulse test board so that the TO-247 3-pin or 4-pin devices released as standard by power device manufacturers can be evaluated on a common board. Taking into consideration the differences in the customer's measuring instrument environment, it is designed so that multiple types of voltage sensing probes and current sensing probes can be connected.
Click here for the reference manual
What is a double pulse test?
A double pulse test involves connecting an inductive load to a half-bridge circuit, applying an arbitrary voltage, and applying pulses multiple times to control the current value flowing through the inductive load. Observe the switching characteristics of
Product features
This board is designed for the purpose of performing a general double pulse test for evaluating power switching devices such as SiC FETs. It has a half-bridge circuit configuration, and the necessary gate driver and power supply circuit are already installed. Various probes and current sensors are also supported.
- Supports double pulse test up to 1700V, 150A
- Prepare through holes for TO-247-4L and TO-247-3L
- Operates from a single +12V power supply
- Includes adjustable isolated power supply for gate drive (~25V/depending on Zener diode selection)
- Jumper Configurable Zero or Negative Gate Drive Bias
- Employs a driver IC with built-in Miller clamp
- Equipped with connectors and probe contacts for optical isolation probes for VDS and VGS probing
- CTs, coaxial shunt resistors, and Rogowski coils can be used as current sensors
Block Diagram
Introduction video (approx. 7 minutes)
Inquiry
This board is designed exclusively for double pulse testing. Continuous energization is not assumed. We can also provide evaluation services for customers who do not have a measurement environment. If you would like to request an evaluation service, please contact us.